Indexing of Crystal Diffraction Patterns
portes grátis
Indexing of Crystal Diffraction Patterns
From Crystallography Basics to Methods of Automatic Indexing
Morawiec, Adam
Springer International Publishing AG
09/2022
418
Dura
Inglês
9783031110764
15 a 20 dias
Descrição não disponível.
Geometric crystallography.- Basic aspects of crystal diffraction.- Diffraction of high energy electrons.- Cartesian reference frames in diffractometry.- Indexing of single crystal diffraction patterns.- Ab-inito indexing of Laue patterns.- Indexing of powder diffraction patterns.- Indexing for orientation determination.- Indexing of spot-type diffraction patterns.- Complications in indexing.- Multigrain indexing.- Beyond diffraction by periodic crystals.- Quasicrystals.- Strain determination
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Crystallographic Computing;Ab Initio Indexing of Diffraction Patterns;Single Crystal Diffraction;Three-Dimensional Fourier Transformation;Ab Initio Indexing of Laue Patterns;Indexing of Powder Diffraction Patterns;Indexing for Orientation Determination;Direct Pattern Matching;Spot-Type Diffraction Patterns;Multigrain Indexing;Diffraction Patterns of Quasicrystals;X-Ray Diffraction Strain Determination;Three-Dimensional Ab-Initio Indexing;High Energy Electron Diffraction
Geometric crystallography.- Basic aspects of crystal diffraction.- Diffraction of high energy electrons.- Cartesian reference frames in diffractometry.- Indexing of single crystal diffraction patterns.- Ab-inito indexing of Laue patterns.- Indexing of powder diffraction patterns.- Indexing for orientation determination.- Indexing of spot-type diffraction patterns.- Complications in indexing.- Multigrain indexing.- Beyond diffraction by periodic crystals.- Quasicrystals.- Strain determination
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Crystallographic Computing;Ab Initio Indexing of Diffraction Patterns;Single Crystal Diffraction;Three-Dimensional Fourier Transformation;Ab Initio Indexing of Laue Patterns;Indexing of Powder Diffraction Patterns;Indexing for Orientation Determination;Direct Pattern Matching;Spot-Type Diffraction Patterns;Multigrain Indexing;Diffraction Patterns of Quasicrystals;X-Ray Diffraction Strain Determination;Three-Dimensional Ab-Initio Indexing;High Energy Electron Diffraction