Transmission Electron Microscopy

Electron Sources.- FIB of TEM Specimens.- In-Situ and Operando Experiments.- Applying a Stimulus to the Specimen.- In-Situ Irradiation.- Cryogenic Electron Microscopy.- Electron Diffraction and Phase Identification.- CBED: Symmetry and Large-Angle Patterns.- Electron Crystallography, Charge-Density Mapping and Nanodiffraction.- DigitalMicrograph.- Electron Waves, Interference & Coherence.- Electron Holography.- Focal-Series Reconstruction (FSR).- Single Atom Counting in HREM.- Quantitative STEM.- Imaging in the STEM.- 4D STEM.- Nanoparticle Characterization.- Electron Tomography (ET).- EFTEM.- Calculating EELS.- Diffraction AND X-ray Excitation.- X-ray and EELS Imaging.- Practical Aspects and Advanced Applications of XEDS.

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• Ensaio de materiais
• Mecânica dos sólidos
• Microscopia
• Física da Matéria Condensada (física do estado sólido e estado líquido)
• Análise de espectro, spectrochemistry, espectrometria de massa

EELS;EFTEM;Electron Diffraction;Electron Holography;Electron Sources;Electron Tomography;Focal-series reconstruction;Operando TEM;Spectrum Imaging;TEM Textbook;Transmission Electron Microscopy;XEDS;Nanoparticle Characterization