Scanning Transmission Electron Microscopy
portes grátis
Scanning Transmission Electron Microscopy
Advanced Characterization Methods for Materials Science Applications
Bruma, Alina
Taylor & Francis Ltd
10/2024
150
Mole
9780367655389
15 a 20 dias
Descrição não disponível.
Chapter 1 Practical Aspects of Quantitative and High-Fidelity STEM Data Recording Chapter 2 Machine Learning for Electron Microscopy Chapter 3 Application of Advanced Aberration-Corrected Transmission Electron Microscopy to Material Science: Methods to Predict New Structures and Their Properties Chapter 4 Large Dataset Electron Diffraction Patterns for the Structural Analysis of Metallic Nanostructures
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Electron DP;materials characterization techniques;HRTEM Image;perovskites;Atomic Column;HAADF-STEM;Advanced TEM;crystallography;ADF Detector;nanomaterials;Crystal Orientation Map;electron diffraction techniques;American Chemical Society;Quantitative annular dark field data;M2 Phase;Scanning transmission electron microscopy;Line Intensity Profile;Machine learning;ZnO Nanorod;Materials science applications;Max Pooling Layers;Oxygen Vacancies;De Backer;Zone Axis;Simulated Electron DP;Unsupervised Machine Learning;Au Nanoparticles;Convolutional Layer;EDX Elemental Mapping;Electron Diffraction;NBD;Bright Dots;ADF Image;Unit Cell Parameters;Perovskite Structure
Chapter 1 Practical Aspects of Quantitative and High-Fidelity STEM Data Recording Chapter 2 Machine Learning for Electron Microscopy Chapter 3 Application of Advanced Aberration-Corrected Transmission Electron Microscopy to Material Science: Methods to Predict New Structures and Their Properties Chapter 4 Large Dataset Electron Diffraction Patterns for the Structural Analysis of Metallic Nanostructures
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Electron DP;materials characterization techniques;HRTEM Image;perovskites;Atomic Column;HAADF-STEM;Advanced TEM;crystallography;ADF Detector;nanomaterials;Crystal Orientation Map;electron diffraction techniques;American Chemical Society;Quantitative annular dark field data;M2 Phase;Scanning transmission electron microscopy;Line Intensity Profile;Machine learning;ZnO Nanorod;Materials science applications;Max Pooling Layers;Oxygen Vacancies;De Backer;Zone Axis;Simulated Electron DP;Unsupervised Machine Learning;Au Nanoparticles;Convolutional Layer;EDX Elemental Mapping;Electron Diffraction;NBD;Bright Dots;ADF Image;Unit Cell Parameters;Perovskite Structure