Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy

Advanced Characterization Methods for Materials Science Applications

Bruma, Alina

Taylor & Francis Ltd

10/2024

150

Mole

9780367655389

Pré-lançamento - envio 15 a 20 dias após a sua edição

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Chapter 1 Practical Aspects of Quantitative and High-Fidelity STEM Data Recording Chapter 2 Machine Learning for Electron Microscopy Chapter 3 Application of Advanced Aberration-Corrected Transmission Electron Microscopy to Material Science: Methods to Predict New Structures and Their Properties Chapter 4 Large Dataset Electron Diffraction Patterns for the Structural Analysis of Metallic Nanostructures
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Electron DP;materials characterization techniques;HRTEM Image;perovskites;Atomic Column;HAADF-STEM;Advanced TEM;crystallography;ADF Detector;nanomaterials;Crystal Orientation Map;electron diffraction techniques;American Chemical Society;Quantitative annular dark field data;M2 Phase;Scanning transmission electron microscopy;Line Intensity Profile;Machine learning;ZnO Nanorod;Materials science applications;Max Pooling Layers;Oxygen Vacancies;De Backer;Zone Axis;Simulated Electron DP;Unsupervised Machine Learning;Au Nanoparticles;Convolutional Layer;EDX Elemental Mapping;Electron Diffraction;NBD;Bright Dots;ADF Image;Unit Cell Parameters;Perovskite Structure