Scanning Ion Conductance Microscopy

Scanning Ion Conductance Microscopy

Schaeffer, Tilman E.

Springer International Publishing AG

09/2022

230

Dura

Inglês

9783031144424

15 a 20 dias

Descrição não disponível.
The evolution of scanning ion conductance microscopy.- Scanning ion conductance microscopy and atomic force microscopy: A comparison of strengths and limitations for biological investigations.- Ions and electrons with scanning ion conductance microscopy.- Ion channel recording with a smart patch-clamp system.- Understanding cardiac structure and function at nanoscale resolution with SICM.- Local Electrochemical Characterization using Scanning Electrochemical Cell Microscopy.- Comparison of scanning ion conductance microscopy with scanning electron microscopy for imaging cells and tissues.- Correlating scanning ion conductance and super-resolved fluorescence microscopy.
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scanning ion conductance microscopy (SICM);atomic force microscopy;Ion channel recording;smart patch-clamp system;nanopipettes;surface positioning;functional imaging