Reliability of CMOS Analog ICs
portes grátis
Reliability of CMOS Analog ICs
Kuntman, Hakan; OEzcelep, Yasin; OEzenli, Deniz; Kacar, Firat
Springer International Publishing AG
04/2025
100
Dura
9783031854545
Pré-lançamento - envio 15 a 20 dias após a sua edição
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Introduction.- The reliability model for PMOS and NMOS transistors based on statistical methods.- Demonstration of Proposed Method with Application Examples.- On the degradation of OTA-C-based CMOS low-power filter circuits for biomedical instrumentation.- Power MOSFET degradation and statistical investigation of the degradation effect on DC-DC converters and converter parameters.
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Analog IC Design;CMOS Circuit Design;Analog Filters;reliability model for PMOS and NMOS transistors;Power MOSFET degradation
Introduction.- The reliability model for PMOS and NMOS transistors based on statistical methods.- Demonstration of Proposed Method with Application Examples.- On the degradation of OTA-C-based CMOS low-power filter circuits for biomedical instrumentation.- Power MOSFET degradation and statistical investigation of the degradation effect on DC-DC converters and converter parameters.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
