Quality Infrastructure Of Graphene And Related Two-dimensional Materials: Metrology
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Quality Infrastructure Of Graphene And Related Two-dimensional Materials: Metrology
Ren, Lingling; Li, Xin
World Scientific Publishing Co Pte Ltd
10/2024
250
Dura
9789811295706
Pré-lançamento - envio 15 a 20 dias após a sua edição
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Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Graphene Related Materials, Metrology, National Quality Infrastructure, Standard, Comparison, Measurement Method, Standardization, Reference Materials, Uncertainty Evaluation, En Value, Nanotechnology, Measurement Standard, Calibration, Traceability, Laboratory Accreditation, Technical Specification, Thickness, Flake Size, Coverage, Carbon Oxygen Ratio, Chemical Composition, Metallic Impurity, Raman Spectroscopy, X-ray Diffraction, Atomic Force Microscopy, Scanning Electron Microscopy, Transmission Electron Microscopy, X-ray Photoelectron Spectroscopy, Inductively Coupled Plasma Mass Spectrometry
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Graphene Related Materials, Metrology, National Quality Infrastructure, Standard, Comparison, Measurement Method, Standardization, Reference Materials, Uncertainty Evaluation, En Value, Nanotechnology, Measurement Standard, Calibration, Traceability, Laboratory Accreditation, Technical Specification, Thickness, Flake Size, Coverage, Carbon Oxygen Ratio, Chemical Composition, Metallic Impurity, Raman Spectroscopy, X-ray Diffraction, Atomic Force Microscopy, Scanning Electron Microscopy, Transmission Electron Microscopy, X-ray Photoelectron Spectroscopy, Inductively Coupled Plasma Mass Spectrometry
